James E. Murguia

Short-time failure of metal interconnect caused by current pulses

James E. Murguia, J.B. Bernstein · IEEE Electron Device Letters · 1993 · 43 citations

Engineering, New Criterion, Interconnect (Integrated Circuits) +17

Use of focused-ion-beam and modeling to optimize submicron MOSFET characteristics

Chih-Chieh Shen, James E. Murguia, Neil Goldsman et al. · IEEE Transactions on Electron Devices · 1998 · 32 citations

Device Modeling, Output Resistance, Electrical Engineering +12

<title>Compact visible/near-infrared hyperspectral imager</title>

James E. Murguia, Toby D. Reeves, Jonathan M. Mooney et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 28 citations

Engineering, Image Analysis, Infrared Optic +19

Evaluation of a PtSi infrared camera

James E. Murguia · Optical Engineering · 1990 · 15 citations

Charge Partitioning, Engineering, Visible Imagers +22

Increase in silicon charge coupled devices speed with focused ion beam implanted channels

James E. Murguia, M. I. Shepard, J. Melngailis et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 10 citations

Engineering, Coulomb Repulsion, Ion Beam Instrumentation +19