Jungjae Park

Temperature Measurement of Visible Light-Emitting Diodes Using Nematic Liquid Crystal Thermography With Laser Illumination

C.C. Lee, Jungjae Park · IEEE Photonics Technology Letters · 2004 · 65 citations

Engineering, Junction Temperature, Thermal Radiation +16

Uncertainty improvement of geometrical thickness and refractive index measurement of a silicon wafer using a femtosecond pulse laser

Saerom Maeng, Jungjae Park, O Byungsung et al. · Optics Express · 2012 · 58 citations · Full text

Engineering, Optical Testing, Interferometry +16

Thermal Modeling and Measurement of AlGaN–GaN HFETs Built on Sapphire and SiC Substrates

Jungjae Park, Moo Whan Shin, C.C. Lee · IEEE Transactions on Electron Devices · 2004 · 56 citations

Materials Engineering, Wide-bandgap Semiconductor, Electrical Engineering +14

Measurement of thickness profile and refractive index variation of a silicon wafer using the optical comb of a femtosecond pulse laser

Jungjae Park, Jonghan Jin, Jae Wan Kim et al. · Optics Communications · 2013 · 41 citations

Photonics, Advanced Laser Processing, Optical Materials +9

Vibration-insensitive measurements of the thickness profile of large glass panels

Jungjae Park, Jaeseok Bae, Jonghan Jin et al. · Optics Express · 2015 · 34 citations · Full text

Optical Materials, Engineering, Optical Testing +30