Jae Wan Kim - Concepedia

Author

Jae Wan Kim

Korea Research Institute of Standards and Science ORCID

Also Known As

Jae Wan Kim, Jong-Ahn Kim, Tae Bong Eom

Publications

417

Citations

H-Index

Concepts

All Affiliations

Korea Research Institute of Standards and Science Korea University of Science and Technology

About

Jae Wan Kim is an author at Korea Research Institute of Standards and Science specializing in engineering, instrumentation, and calibration.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	12	15	348
2	Applied Physics	10	10	233
3	Education	6	6	132
4	Natural Sciences	3	3	82
5	Medicine	1	1	29

Jae Wan Kim

Publications

348

Citations

H-Index

Page 1

	Year	Citations
Design of the KRISS watt balance Dong‐Min Kim, Byung-Chill Woo, Kwang-Cheol Lee, Metrologia EngineeringEnergy EfficiencyEnergy ConversionMeasurementEducation	2014	61
Measurement of thickness profile and refractive index variation of a silicon wafer using the optical comb of a femtosecond pulse laser Jungjae Park, Jonghan Jin, Jae Wan Kim, Optics Communications PhotonicsAdvanced Laser ProcessingOptical MaterialsEngineeringOptical Properties	2013	41
Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process Jonghan Jin, Jae Wan Kim, Chu-Shik Kang, Optics Express EngineeringOptical TestingSilicon ViasSilicon On InsulatorDepth Inspection	2012	37
Measurement of microscope calibration standards in nanometrology using a metrological atomic force microscope Jong-Ahn Kim, Jae Wan Kim, Byong Chon Park, Measurement Science and Technology EngineeringMeasurementMicroscopyMechanical EngineeringMicroscopy Method	2006	29
Fizeau-type interferometric probe to measure geometrical thickness of silicon wafers Jonghan Jin, Saerom Maeng, Jungjae Park, Optics Express Optical Interferometric ProbeOptical MaterialsEngineeringOptical Transmission SystemMeasurement	2014	29
Uncertainty analysis of absolute concentration measurement with continuous-wave cavity ringdown spectroscopy Jae Wan Kim, Yong Shim Yoo, Jae Yong Lee, Applied Optics EngineeringAtomic Emission SpectroscopyMeasurementAbsorption SpectroscopyCalibration	2001	23
Metrological atomic force microscope using a large range scanning dual stage Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang, International Journal of Precision Engineering and Manufacturing Materials ScienceEngineeringElectron MicroscopyPhysicsMicrofabrication	2009	22
An interferometric calibration system for various linear artefacts using active compensation of angular motion errors Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang, Measurement Science and Technology EngineeringMeasurementInterferometryEducationAngular Motion Errors	2011	17
An interferometric system for measuring thickness of parallel glass plates without 2π ambiguity using phase analysis of quadrature Haidinger fringes Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang, Review of Scientific Instruments Optical MaterialsEngineeringMeasurementHaidinger FringesMechanical Engineering	2017	15
Note: An absolute X-Y-Θ position sensor using a two-dimensional phase-encoded binary scale Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang, Review of Scientific Instruments Sensor CalibrationImage SensorEngineeringPlanar MotionSensors	2018	14

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