Concepedia

Jae Wan Kim

JW

Statistics

Publications

15

Citations

348

H-Index

12

Active since

2001

Affiliations

Korea Research Institute of Standards and Science(Current)

Korea University of Science and Technology

Jae Wan Kim is an author at Korea Research Institute of Standards and Science specializing in engineering, instrumentation, and calibration.

Top concepts

EngineeringInstrumentationCalibrationApplied PhysicsMeasurementInterferometryOptical PropertiesEducationPhotonicsLength Metrology

Publications per year

2001–2018

15

Publications

15

Design of the KRISS watt balance

Dong‐Min Kim, Byung-Chill Woo, Kwang-Cheol Lee et al. · Metrologia · 2014 · 61 citations

Engineering, Energy Efficiency, Energy Conversion +16

Measurement of thickness profile and refractive index variation of a silicon wafer using the optical comb of a femtosecond pulse laser

Jungjae Park, Jonghan Jin, Jae Wan Kim et al. · Optics Communications · 2013 · 41 citations

Photonics, Advanced Laser Processing, Optical Materials +9

Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process

Jonghan Jin, Jae Wan Kim, Chu-Shik Kang et al. · Optics Express · 2012 · 37 citations · Full text

Engineering, Optical Testing, Silicon Vias +22

Measurement of microscope calibration standards in nanometrology using a metrological atomic force microscope

Jong-Ahn Kim, Jae Wan Kim, Byong Chon Park et al. · Measurement Science and Technology · 2006 · 29 citations

Engineering, Measurement, Microscopy +20

Fizeau-type interferometric probe to measure geometrical thickness of silicon wafers

Jonghan Jin, Saerom Maeng, Jungjae Park et al. · Optics Express · 2014 · 29 citations · Full text

Optical Interferometric Probe, Optical Materials, Engineering +29

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