Statistics
Publications
35
Citations
944
H-Index
19
Active since
2000
Jong-Ahn Kim is an author at Korea Research Institute of Standards and Science specializing in engineering, instrumentation, and calibration.
Publications per year
2000–2023
35
35
Thickness and refractive index measurement of a silicon wafer based on an optical comb
Jonghan Jin, Jae Wan Kim, Chu-Shik Kang et al. · Optics Express · 2010 · 97 citations · Full text
Design of the KRISS watt balance
Dong‐Min Kim, Byung-Chill Woo, Kwang-Cheol Lee et al. · Metrologia · 2014 · 61 citations
A passive method to compensate nonlinearity in a homodyne interferometer
Jeongho Ahn, Jong-Ahn Kim, Chu-Shik Kang et al. · Optics Express · 2009 · 52 citations · Full text
Absolute angle measurement using a phase-encoded binary graduated disk
Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang et al. · Measurement · 2015 · 42 citations
1–5 of 35