Concepedia

Jong-Ahn Kim

JK

Statistics

Publications

35

Citations

960

H-Index

19

Active since

2000

Affiliations

Korea Research Institute of Standards and Science(Current)

Korea University of Science and Technology

Korea Advanced Institute of Science and Technology

Jong-Ahn Kim is an author at Korea Research Institute of Standards and Science specializing in engineering, optical metrology, and metrology.

Publications per year

2000–2023

35

Publications

35

Thickness and refractive index measurement of a silicon wafer based on an optical comb

Jonghan Jin, Jae Wan Kim, Chu-Shik Kang et al. · Optics Express · 2010 · 97 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Design of the KRISS watt balance

Byung-Chill Woo, Kwang-Cheol Lee, Choi Kee-Bong et al. · Metrologia · 2014 · 61 citations

Engineering, Electrical Engineering, Mechanical Engineering +15

Six-degree-of-freedom displacement measurement system using a diffraction grating

Jong-Ahn Kim, Kyung‐Chan Kim, Euiwon Bae et al. · Review of Scientific Instruments · 2000 · 53 citations

Engineering, Mechatronics Engineering, Equipment +15

A passive method to compensate nonlinearity  in a homodyne interferometer

Jeongho Ahn, Jong-Ahn Kim, Chu-Shik Kang et al. · Optics Express · 2009 · 52 citations · Full text

Natural Sciences, Physics, Optics +14

Measurement of thickness profile and refractive index variation of a silicon wafer using the optical comb of a femtosecond pulse laser

Jungjae Park, Jonghan Jin, Jae Wan Kim et al. · Optics Communications · 2013 · 42 citations

Engineering, Materials Engineering, Materials Science +17

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