Jae Wan Kim - Concepedia

Author

Jae Wan Kim

Korea Research Institute of Standards and Science

Also Known As

Jae Wan Kim, Jong-Ahn Kim

Publications

317

Citations

H-Index

Concepts

All Affiliations

Korea Research Institute of Standards and Science

About

Jae Wan Kim is an author at Korea Research Institute of Standards and Science specializing in engineering, applied physics, and instrumentation.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	246
2	Applied Physics	6	6	222
3	Education	3	3	55
4	Mechanical Engineering	3	3	65
5	Mechanics	1	1	34

Jae Wan Kim

Publications

257

Citations

H-Index

Page 1

	Year	Citations
Thickness and refractive index measurement of a silicon wafer based on an optical comb Jonghan Jin, Jae Wan Kim, Chu-Shik Kang, Optics Express Optical MaterialsEngineeringOptical TestingMicro-optical ComponentSilicon On Insulator	2010	97
A simple phase-encoding electronics for reducing the nonlinearity error of a heterodyne interferometer Tae Bong Eom, Jong Ahn Kim, Chu-Shik Kang, Measurement Science and Technology EngineeringLaser ScienceOptical Transmission SystemInterferometryOptical Metrology	2008	38
Vibration-insensitive measurements of the thickness profile of large glass panels Jungjae Park, Jaeseok Bae, Jonghan Jin, Optics Express Optical MaterialsEngineeringOptical TestingMechanical EngineeringOptic Design	2015	34
Calibration of angle artifacts and instruments using a high precision angle generator Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang, International Journal of Precision Engineering and Manufacturing Sensor CalibrationEngineeringMeasurementCalibrationInstrument Science	2013	24
Measurement of ultralow supermirror birefringence by use of the polarimetric differential cavity ringdown technique Jae Yong Lee, Hai-Woong Lee, Jae Wan Kim, Applied Optics Cavity MirrorPhotonicsEngineeringPhysicsOphthalmology	2000	22
Characteristics of laser scanning confocal microscopes for surface texture measurements Jariya Buajarern, Chu-Shik Kang, Jae Wan Kim Surface Topography Metrology and Properties EngineeringMicroscopyOptical TestingMechanical EngineeringInterferometry	2013	17
Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry Jong-Ahn Kim, Jae Wan Kim, Tae Bong Eom, Optics Express EngineeringMeasurementOptical TestingGlass PlateMechanical Engineering	2014	14
Note: High precision angle generator using multiple ultrasonic motors and a self-calibratable encoder Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang, Review of Scientific Instruments	2011	11

Page 1