8
Publications
257
Citations
8
H-Index
2000
Active since
Affiliations
Jae Wan Kim is an author at Korea Research Institute of Standards and Science specializing in engineering, applied physics, and instrumentation.
Top concepts
EngineeringApplied PhysicsInstrumentationOptical PropertiesPhotonicsInterferometryEducationOptical SystemsOptical MetrologyOptical Components
Publications per year
2000–2015
8
8
Thickness and refractive index measurement of a silicon wafer based on an optical comb
Jonghan Jin, Jae Wan Kim, Chu-Shik Kang et al. · Optics Express · 2010 · 97 citations · Full text
Vibration-insensitive measurements of the thickness profile of large glass panels
Jungjae Park, Jaeseok Bae, Jonghan Jin et al. · Optics Express · 2015 · 34 citations · Full text
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