Tae Bong Eom

Thickness and refractive index measurement of a silicon wafer based on an optical comb

Jonghan Jin, Jae Wan Kim, Chu-Shik Kang et al. · Optics Express · 2010 · 97 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Measurement of refractive index and thickness of transparent plate by dual-wavelength interference

Hee Joo Choi, Hwan Hong Lim, Han Seb Moon et al. · Optics Express · 2010 · 74 citations · Full text

Natural Sciences, Materials Science, Physics +17

Absolute angle measurement using a phase-encoded binary graduated disk

Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang et al. · Measurement · 2015 · 42 citations

Engineering, Computer Engineering, Instrumentation +11

A simple phase-encoding electronics for reducing the nonlinearity error of a heterodyne interferometer

Tae Bong Eom, Jong Ahn Kim, Chu-Shik Kang et al. · Measurement Science and Technology · 2008 · 39 citations

Natural Sciences, Electrical Engineering, Instrumentation +16

An optical absolute position measurement method using a phase-encoded single track binary code

Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang et al. · Review of Scientific Instruments · 2012 · 37 citations

Engineering, Electrical Engineering, Computer Vision +16