Jaeseok Bae

Vibration-insensitive measurements of the thickness profile of large glass panels

Jungjae Park, Jaeseok Bae, Jonghan Jin et al. · Optics Express · 2015 · 34 citations · Full text

Optical Materials, Engineering, Optical Testing +30

Total physical thickness measurement of a multi-layered wafer using a spectral-domain interferometer with an optical comb

Jaeseok Bae, Jungjae Park, Heulbi Ahn et al. · Optics Express · 2017 · 27 citations · Full text

Engineering, Optical Testing, Mechanical Engineering +17

A novel method for simultaneous measurement of thickness, refractive index, bow, and warp of a large silicon wafer using a spectral-domain interferometer

Jungjae Park, Jaeseok Bae, Yoon‐Soo Jang et al. · Metrologia · 2020 · 26 citations

Optical method for simultaneous thickness measurements of two layers with a significant thickness difference

Jaeseok Bae, Jungjae Park, Heulbi Ahn et al. · Optics Express · 2021 · 26 citations · Full text

Optical Materials, Engineering, Measurement +28

Physical thickness and group refractive index measurement of individual layers for double-stacked microstructures using spectral-domain interferometry

Jungjae Park, Jaeseok Bae, Jong-Ahn Kim et al. · Optics Communications · 2018 · 19 citations

Materials Science, Photonics, Engineering +13