A. Kornfeld

Process Technology Variation

Kelin J. Kuhn, M.D. Giles, D. Becher et al. · IEEE Transactions on Electron Devices · 2011 · 360 citations

Law Technology Scaling, Engineering, Vlsi Design +19

Tunneling and dark currents in HgCdTe photodiodes

Y. Nemirovsky, Dana Rosenfeld, R. Adar et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1989 · 96 citations

Trap-assisted Tunneling, Engineering, Semiconductor Device +16

Compact BJT-Based Thermal Sensor for Processor Applications in a 14 nm tri-Gate CMOS Process

Takao Oshita, Joseph Shor, D. Duarte et al. · IEEE Journal of Solid-State Circuits · 2015 · 89 citations

Compact Thermal Sensors, Engineering, Vlsi Design +24

Gate-controlled Hg1−<i>x</i>Cd<i>x</i>Te photodiodes passivated with native sulfides

Y. Nemirovsky, R. Adar, A. Kornfeld et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1986 · 62 citations

Engineering, Optoelectronic Devices, Integrated Circuits +17

High sigma measurement of random threshold voltage variation in 14nm Logic FinFET technology

M.D. Giles, N. Arkali Radhakrishna, D. Becher et al. · 2015 · 49 citations

Low-power Electronics, Electrical Engineering, Engineering +9