A. Kornfeld

Process Technology Variation

Kelin J. Kuhn, M.D. Giles, D. Becher et al. · IEEE Transactions on Electron Devices · 2011 · 365 citations

Engineering, Computer Engineering, Electrical Engineering +17

Tunneling and dark currents in HgCdTe photodiodes

Y. Nemirovsky, Dana Rosenfeld, R. Adar et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1989 · 97 citations

Engineering, Electrical Engineering, Materials Science +17

Compact BJT-Based Thermal Sensor for Processor Applications in a 14 nm tri-Gate CMOS Process

Takao Oshita, Joseph Shor, D. Duarte et al. · IEEE Journal of Solid-State Circuits · 2015 · 91 citations

Engineering, Computer Engineering, Electrical Engineering +15

Gate-controlled Hg1−<i>x</i>Cd<i>x</i>Te photodiodes passivated with native sulfides

Y. Nemirovsky, R. Adar, A. Kornfeld et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1986 · 62 citations

Engineering, Electrical Engineering, Materials Science +17

High sigma measurement of random threshold voltage variation in 14nm Logic FinFET technology

M.D. Giles, N. Arkali Radhakrishna, D. Becher et al. · 2015 · 49 citations

Engineering, Computer Engineering, Electrical Engineering +15