D.E. Ioannou

A SEM-EBIC minority-carrier diffusion-length measurement technique

D.E. Ioannou, C.A. Dimitriadis · IEEE Transactions on Electron Devices · 1982 · 126 citations

Engineering, Nuclear Physics, Diffusion Length +20

A manufacturable dual channel (Si and SiGe) high-k metal gate CMOS technology with multiple oxides for high performance and low power applications

Siddarth Krishnan, U. Kwon, N. Moumen et al. · 2011 · 81 citations

Sige Channels, Low Power Applications, Engineering +16

Formation of buried insulating layers in silicon by the implantation of high doses of oxygen

P.L.F. Hemment, E.A. Maydell-Ondrusz, K.G. Stephens et al. · Nuclear Instruments and Methods in Physics Research · 1983 · 72 citations

Materials Science, Ion Implantation, Engineering +8

The effect of heat treatment on Au Schottky contacts on β-SiC

D.E. Ioannou, N. A. Papanicolaou, P. E. R. Nordquist · IEEE Transactions on Electron Devices · 1987 · 58 citations

A SEM-EBIC minority-carrier lifetime-measurement technique

D.E. Ioannou · Journal of Physics D Applied Physics · 1980 · 27 citations

Engineering, Measurement, Charge Transport +19