Statistics
Publications
6
Citations
165
H-Index
6
Active since
1996
V. Tran is an author at The Aerospace Corporation specializing in hardware security, computer engineering, and engineering.
Publications per year
1996–2005
6
6
SEU-hardened storage cell validation using a pulsed laser
R. Velazco, T. Calin, M. Nicolaidis et al. · IEEE Transactions on Nuclear Science · 1996 · 48 citations
SEE sensitivities of selected advanced flash and first-in-first-out memories
Topology-related upset mechanisms in design hardened storage cells
T. Calin, Raoul Velazco, M. Nicolaidis et al. · 2002 · 21 citations
Hardware Security, Defect Tolerance, Electrical Engineering +13
SEE sensitivity trends in non-hardened high density SRAMs with sub-micron feature sizes
J. George, R. Koga, K.B. Crawford et al. · 2004 · 20 citations
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