Brian E. Coss

Near band edge Schottky barrier height modulation using high-κ dielectric dipole tuning mechanism

Brian E. Coss, W.Y. Loh, Robert M. Wallace et al. · Applied Physics Letters · 2009 · 50 citations

Engineering, Optoelectronic Devices, Semiconductor Device +17

Contact Resistance Reduction to FinFET Source/Drain Using Novel Dielectric Dipole Schottky Barrier Height Modulation Method

Brian E. Coss, Casey Smith, Wei-Yip Loh et al. · IEEE Electron Device Letters · 2011 · 28 citations

Electrical Engineering, Contact Resistance Reduction, Engineering +10

<i>In‐situ</i> X‐ray photoelectron spectroscopy of trimethyl aluminum and water half‐cycle treatments on HF‐treated and O₃‐oxidized GaN substrates

P. Sivasubramani, Tae Joo Park, Brian E. Coss et al. · physica status solidi (RRL) - Rapid Research Letters · 2011 · 24 citations

Materials Engineering, Materials Science, Aluminium Nitride +14

Effects of O3 and H2O oxidants on C and N-related impurities in atomic-layer-deposited La2O3 films observed by <i>in situ</i> x-ray photoelectron spectroscopy

Tae Joo Park, P. Sivasubramani, Brian E. Coss et al. · Applied Physics Letters · 2010 · 20 citations

Oxide Heterostructures, Materials Science, H2o Oxidants +14

Measurement of Schottky barrier height tuning using dielectric dipole insertion method at metal–semiconductor interfaces by photoelectron spectroscopy and electrical characterization techniques

Brian E. Coss, P. Sivasubramani, Barry Brennan et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2013 · 17 citations

Engineering, Optoelectronic Devices, Semiconductor Device +16