S. Kohyama - Concepedia

Author

S. Kohyama

Toshiba (Japan)

Also Known As

Kohyama, Susumu, S. Kohyama, Susumu KOHYAMA, Susumu Kohyama

Publications

551

Citations

H-Index

Concepts

All Affiliations

Toshiba (Japan)

About

S. Kohyama is an author at Toshiba (Japan) specializing in engineering, microelectronics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	20	412
2	Applied Physics	11	12	255
3	Chemical Engineering	2	2	49
4	Education	1	1	16
5	Natural Sciences	1	1	49

S. Kohyama

Publications

452

Citations

H-Index

Page 1

	Year	Citations
A Thermionic Electron Emission Model for Charge Retention in SAMOS Structure Hiroshi Nozawa, S. Kohyama Japanese Journal of Applied Physics EngineeringCharge RetentionCharge TransportElectronic StructureSemiconductor Device	1982	49
Selective polysilicon oxidation technology for VLSI isolation N. Matsukawa, Hiroshi Nozawa, J. Matsunaga, IEEE Transactions on Electron Devices EngineeringVlsi DesignField Isolation TechnologyIntegrated CircuitsSilicon On Insulator	1982	38
A low power 46 ns 256 kbit CMOS static RAM with dynamic double word line T. Sakurai, J. Matsunaga, M. Isobe, IEEE Journal of Solid-State Circuits Hardware SecurityLow-power ElectronicsElectrical EngineeringEngineeringVlsi Design	1984	37
Characterization of Polycrystalline Silicon MOS Transistors and Its Film Properties. I Shinji Onga, Yoshihisa Mizutani, Kenji Taniguchi, Japanese Journal of Applied Physics Materials ScienceSemiconductor TechnologyElectrical EngineeringEngineeringCrystalline Defects	1982	35
A 64Kb CMOS RAM Satoshi Konishi, J. Matsunaga, T. Ohtani, Hardware SecurityFault-tolerant 8K×8bElectrical EngineeringMemory ArchitectureEngineering	1982	29
Characterization of two step impact ionization and its influence in NMOS and PMOS VLSI's J. Matsunaga, H.S. Momose, H. Iizuka, Secondary ImpactEngineeringIon ProcessSemiconductor DeviceIon Implantation	1980	26
Evidence for impact-ionized electron injection in substrate of <i>n</i>-channel MOS structures J. Matsunaga, S. Kohyama Applied Physics Letters Device ModelingSemiconductor TechnologyElectrical EngineeringEngineeringPhysics	1978	24
A 15nW standby power 64Kb CMOS RAM K. Ochii, Kazuhiko Hashimoto, Hiroshi Yasuda, Low-power ElectronicsElectrical EngineeringEngineeringMulti-channel Memory ArchitectureComputer Engineering	1982	19
Fault tolerant 92160 bit multiphase CCD memory Ben R. Elmer, W.E. Tchon, A.J. Denboer, Hardware SecurityFault Tolerant 92160EngineeringSerial Memory DeviceComputer Engineering	1977	16
On-chip capacitance measurement circuits in VSLI structures Hiroshi Iwai, S. Kohyama IEEE Transactions on Electron Devices Precise Capacitance MeasurementsElectrical EngineeringAc Voltage MeasurementEngineeringVlsi Design	1982	16

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