S. Kohyama

A Thermionic Electron Emission Model for Charge Retention in SAMOS Structure

Hiroshi Nozawa, S. Kohyama · Japanese Journal of Applied Physics · 1982 · 49 citations

Engineering, Charge Retention, Charge Transport +19

Selective polysilicon oxidation technology for VLSI isolation

N. Matsukawa, Hiroshi Nozawa, J. Matsunaga et al. · IEEE Transactions on Electron Devices · 1982 · 38 citations

Engineering, Vlsi Design, Field Isolation Technology +16

A low power 46 ns 256 kbit CMOS static RAM with dynamic double word line

T. Sakurai, J. Matsunaga, M. Isobe et al. · IEEE Journal of Solid-State Circuits · 1984 · 37 citations

Hardware Security, Low-power Electronics, Electrical Engineering +13

Characterization of Polycrystalline Silicon MOS Transistors and Its Film Properties. I

Shinji Onga, Yoshihisa Mizutani, Kenji Taniguchi et al. · Japanese Journal of Applied Physics · 1982 · 35 citations

Materials Science, Semiconductor Technology, Electrical Engineering +13

A 64Kb CMOS RAM

Satoshi Konishi, J. Matsunaga, T. Ohtani et al. · 1982 · 29 citations

Hardware Security, Fault-tolerant 8K×8b, Electrical Engineering +15