Min Chu

Strain: A Solution for Higher Carrier Mobility in Nanoscale MOSFETs

Min Chu, Yongke Sun, U. Aghoram et al. · Annual Review of Materials Research · 2009 · 366 citations

Materials Science, Electrical Engineering, Semiconductor Device +12

Future of Strained Si/Semiconductors in Nanoscale MOSFETs

Scott E. Thompson, S. Suthram, Yubing Sun et al. · 2006 · 81 citations

Semiconductors, Electrical Engineering, Semiconductor Device +14

Comparison between high-field piezoresistance coefficients of Si metal-oxide-semiconductor field-effect transistors and bulk Si under uniaxial and biaxial stress

Min Chu, Toshikazu Nishida, Xiaoliang Lv et al. · Journal of Applied Physics · 2008 · 40 citations

Engineering, Biaxial Stress, Semiconductor Materials +19

Simulation of AlGaN/GaN high-electron-mobility transistor gauge factor based on two-dimensional electron gas density and electron mobility

Min Chu, Andrew D. Koehler, Amit Kumar Gupta et al. · Journal of Applied Physics · 2010 · 31 citations

Wide-bandgap Semiconductor, Semiconductor Technology, Electrical Engineering +12

Extraction of AlGaN/GaN HEMT Gauge Factor in the Presence of Traps

Andrew D. Koehler, Amit Kumar Gupta, Min Chu et al. · IEEE Electron Device Letters · 2010 · 24 citations

Wide-bandgap Semiconductor, Repeatable Gauge Factors, Electrical Engineering +12