Toshikazu Nishida - Concepedia

Author

Toshikazu Nishida

University of Florida ORCID

Also Known As

Nishida, Toshikazu, T Nishida, T. NISHIDA, T. Nishida, TOSHIKAZU NISHIDA, Toshi Nishida, Toshikazu Nishida

254

Publications

7.6K

Citations

H-Index

188

Concepts

All Affiliations

University of Florida North Carolina State University University of Miami

About

Toshikazu Nishida is an author at University of Florida specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	38	91	5.8K
2	Social Sciences	6	6	363
3	Education	4	4	81
4	Natural Sciences	4	4	220
5	Medicine	3	3	111

Toshikazu Nishida

110

Publications

6.9K

Citations

H-Index

Page 1

	Year	Citations
Uniaxial-process-induced strained-Si: extending the CMOS roadmap Scott E. Thompson, Guangyu Sun, Youn Sung Choi, IEEE Transactions on Electron Devices Electrical EngineeringEngineeringNanoelectronicsStress-induced Leakage CurrentUniaxial Stress	2006	578
Physics of strain effects in semiconductors and metal-oxide-semiconductor field-effect transistors Yubing Sun, Scott E. Thompson, Toshikazu Nishida Journal of Applied Physics EngineeringSemiconductor PhysicsBulk SemiconductorsBiaxial StressSemiconductor Materials	2007	507
Comprehensive characterization and failure modes of tungsten microwire arrays in chronic neural implants Abhishek Prasad, Qing-Shan Xue, Viswanath Sankar, Journal of Neural Engineering	2012	297
Lumped Element Modeling of Piezoelectric-Driven Synthetic Jet Actuators Quentin Gallas, Ryan Holman, Toshikazu Nishida, AIAA Journal AeroacousticsEngineeringMechanical EngineeringPrototypical Synthetic JetsChemical Actuator	2003	296
A MEMS acoustic energy harvester Stephen Horowitz, Mark Sheplak, Louis N. Cattafesta, Journal of Micromechanics and Microengineering AeroacousticsElectrical EngineeringEnergy HarvestingEngineeringMicromachines	2006	240
TaN interface properties and electric field cycling effects on ferroelectric Si-doped HfO2 thin films Patrick D. Lomenzo, Qanit Takmeel, Chuanzhen Zhou, Journal of Applied Physics Tan Interface PropertiesEngineeringThin Film Process TechnologySilicon On InsulatorFerroelectric Application	2015	198
Direct-current measurements of oxide and interface traps on oxidized silicon A. Neugroschel, Chih‐Tang Sah, Ki-Lim Han, IEEE Transactions on Electron Devices Electrical EngineeringSemiconductor DeviceEngineeringDirect-current Current-voltageInterface Trap Density	1995	183
Abiotic-biotic characterization of Pt/Ir microelectrode arrays in chronic implants Abhishek Prasad, Qing‐Shan Xue, Robert Dieme, Frontiers in Neuroengineering Tissue EngineeringEngineeringNeuromodulation TherapiesBiomedical EngineeringPt/ir Electrodes	2014	181
Corrosion of tungsten microelectrodes used in neural recording applications Erin Patrick, Mark E. Orazem, Justin C. Sanchez, Journal of Neuroscience Methods Materials ScienceCorrosion ProtectionEngineeringCorrosionMicrofabrication	2011	168
Acoustic energy harvesting using an electromechanical Helmholtz resonator Fei Liu, Alex Phipps, Stephen Horowitz, The Journal of the Acoustical Society of America	2008	152

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