V. Mazzocchi

GeOI pMOSFETs Scaled Down to 30-nm Gate Length With Record Off-State Current

Louis Hutin, C. Le Royer, J.-F. Damlencourt et al. · IEEE Electron Device Letters · 2010 · 122 citations

Engineering, Integrated Circuits, Geoi Pmosfets +17

Advances in 3D CMOS sequential integration

P. Batude, M. Vinet, A. Pouydebasque et al. · 2009 · 114 citations

Engineering, Vlsi Design, Sequential Cmos Integration +17

Detection of Single W-Centers in Silicon

Yoann Baron, Alrik Durand, Péter Udvarhelyi et al. · ACS Photonics · 2022 · 74 citations · Full text

3D monolithic integration: Technological challenges and electrical results

M. Vinet, P. Batude, C. Tabone et al. · Microelectronic Engineering · 2010 · 65 citations

3D Ic Architecture, Engineering, Advanced Packaging (Semiconductors) +5

Breakthroughs in 3D Sequential technology

Laurent Brunet, C. Fenouillet-Béranger, P. Batude et al. · 2018 · 51 citations

Engineering, Computer Architecture, 3D Modeling +25