Scott Sills - Concepedia

Author

Scott Sills

Micron (United States)

Also Known As

S. Sills, Scott E. Sills, Scott Sills

Publications

781

Citations

H-Index

Concepts

All Affiliations

Micron (United States)University of Washington Politecnico di Milano Dexerials (Japan)IBM Research - Zurich

About

Scott Sills is an author at Micron (United States) specializing in engineering, applied physics, and computer engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	15	694
2	Applied Physics	11	12	577
3	Computer Engineering	9	9	387
4	Electrical Engineering	8	8	370
5	Computer Science	2	2	79

Scott Sills

Publications

744

Citations

H-Index

Page 1

	Year	Citations
Creeping Friction Dynamics and Molecular Dissipation Mechanisms in Glassy Polymers Scott Sills, René M. Overney Physical Review Letters EngineeringMechanical EngineeringSoft MatterNanotribologyMolecular Dynamics	2003	117
Voltage-Controlled Cycling Endurance of HfO<sub><italic>x</italic></sub>-Based Resistive-Switching Memory Simone Balatti, Stefano Ambrogio, Zhongqiang Wang, IEEE Transactions on Electron Devices Non-volatile MemoryEngineeringEmerging Memory TechnologyComputer ArchitecturePhase Change Memory	2015	103
Interfacial glass transition profiles in ultrathin, spin cast polymer films Scott Sills, René M. Overney, Wilson Chau, The Journal of Chemical Physics Materials ScienceUltrathin FilmsEngineeringGlass-forming LiquidGlass Transition	2004	72
A copper ReRAM cell for Storage Class Memory applications Scott Sills, Shuichiro Yasuda, J. Strand, Hardware SecurityNon-volatile MemoryElectrical EngineeringEngineeringCopper Reram Cell	2014	62
Process integration of a 27nm, 16Gb Cu ReRAM J. Zahurak, Koji Miyata, Mark H. Fischer, Materials ScienceElectrical EngineeringWafer Scale ProcessingEngineeringCu Reram	2014	54
Molecular dissipation phenomena of nanoscopic friction in the heterogeneous relaxation regime of a glass former Scott Sills, Tomoko Gray, René M. Overney The Journal of Chemical Physics EngineeringGlass-forming LiquidGlass MaterialNanoscopic FrictionSoft Matter	2005	53
Performance comparison of O-based and Cu-based ReRAM for high-density applications Alessandro Calderoni, Scott Sills, Nirmal Ramaswamy Non-volatile MemoryEngineeringEmerging Memory TechnologyComputer ArchitectureResistive Switching Memory	2014	44
Engineering ReRAM for high-density applications Alessandro Calderoni, Scott Sills, Chris Cardon, Microelectronic Engineering Materials EngineeringEngineeringHigh-performance MaterialMaterial PerformanceHigh-density Applications	2015	42
Pulsed cycling operation and endurance failure of metal-oxide resistive (RRAM) Simone Balatti, Stefano Ambrogio, Zhongqiang Wang, Non-volatile MemoryEngineeringMemory DesignEmerging Memory TechnologyEndurance Failure	2014	38
Controlling Nanowear in a Polymer by Confining Segmental Relaxation Bernd Gotsmann, Urs Duerig, Scott Sills, Nano Letters	2006	38

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