F.H. Baumann

The electronic structure at the atomic scale of ultrathin gate oxides

David A. Muller, T. Sorsch, S. Moccio et al. · Nature · 1999 · 955 citations

Materials Science, Ultrathin Gate Oxides, Engineering +7

Two-Dimensional Mapping of the Electrostatic Potential in Transistors by Electron Holography

W.D. Rau, Peter Schwander, F.H. Baumann et al. · Physical Review Letters · 1999 · 367 citations

Electron Holography, Electrical Engineering, Engineering +14

Ultra-thin gate dielectrics: they break down, but do they fail?

B. E. Weir, P. J. Silvėrman, D. Monroe et al. · 2002 · 205 citations

Electrical Engineering, Semiconductor Device, Engineering +13

Quantitative chemical lattice imaging: theory and practice

A. Ourmazd, F.H. Baumann, M. Bode et al. · Ultramicroscopy · 1990 · 169 citations

Engineering, Microscopy, Medicine +9

An approach to quantitative high-resolution transmission electron microscopy of crystalline materials

Christian Kisielowski, Peter Schwander, F.H. Baumann et al. · Ultramicroscopy · 1995 · 148 citations

Materials Science, Engineering, Electron Microscopy +6