O. Roux-dit-Buisson

Statistics

Publications

Citations

289

H-Index

Active since

1992

Affiliations

Centre National de la Recherche Scientifique(Current)

CEA Grenoble

O. Roux-dit-Buisson is an author at Centre National de la Recherche Scientifique specializing in microelectronics, engineering, and electrical engineering.

Publications per year

1992–2003

Publications

Accurate modeling of trench isolation induced mechanical stress effects on MOSFET electrical performance

R.A. Bianchi, G. Bouche, O. Roux-dit-Buisson · 2003 · 143 citations

Engineering, Computer Engineering, Electrical Engineering +17

Impact of Scaling Down on Low Frequency Noise in Silicon MOS Transistors

G. Ghibaudo, O. Roux-dit-Buisson, J. Brini · physica status solidi (a) · 1992 · 71 citations

Engineering, Electrical Engineering, Circuit Theory +16

Dimension scaling of 1/f noise in the base current of quasiself-aligned polysilicon emitter bipolar junction transistors

P. Llinarès, D. Céli, O. Roux-dit-Buisson et al. · Journal of Applied Physics · 1997 · 39 citations

Engineering, Electrical Engineering, Microelectronics +16

Low Frequency Fluctuations in Scaled Down Silicon CMOS Devices Status and Trends

G. Ghibaudo, O. Roux-dit-Buisson · European Solid-State Device Research Conference · 1994 · 25 citations

Engineering, Electrical Engineering, Microelectronics +16

Scaling down and low-frequency noise in MOSFET’s. Are the RTS’s the ultimate components of the 1/f noise?

J. Brini, G. Ghibaudo, G. Kamarinos et al. · AIP conference proceedings · 1992 · 11 citations

Engineering, Electrical Engineering, Physics +17

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