P. Roitman - Concepedia

Author

P. Roitman

National Institute of Standards and Technology

Also Known As

P Roitman, P. Roitman, P.R. Roitman, Peter Roitman

105

Publications

704

Citations

H-Index

Concepts

All Affiliations

National Institute of Standards and Technology Pennsylvania State University Arizona State University Princeton University

About

P. Roitman is an author at National Institute of Standards and Technology specializing in engineering, applied physics, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	20	558
2	Applied Physics	12	18	465
3	Natural Sciences	2	2	75
4	Health Sciences	1	1	12
5	Medicine	1	1	13

P. Roitman

Publications

572

Citations

H-Index

Page 1

	Year	Citations
Electron and hole trapping in irradiated SIMOX, ZMR and BESOI buried oxides Robert E. Stahlbush, G.J. Campisi, J.B. McKitterick, IEEE Transactions on Nuclear Science Materials ScienceSemiconductor TechnologyChemical EngineeringIrradiated SimoxEngineering	1992	96
Evolution and Future Trends of SIMOX Material S. J. Krause, M.J. Anc, P. Roitman MRS Bulletin Materials EngineeringMaterials ScienceEngineeringOxidation ResistanceMaterial Innovation	1998	77
Electron spin resonance study of E' trapping centers in SIMOX buried oxides John F. Conley, Patrick M. Lenahan, P. Roitman IEEE Transactions on Nuclear Science SpintronicsUltraviolet Illumination SequencesEngineeringPhysicsElectron Spectroscopy	1991	66
Observation of latent reliability degradation in ultrathin oxides after heavy-ion irradiation John S. Suehle, Eric M. Vogel, P. Roitman, Applied Physics Letters Materials ScienceUltrathin OxidesElectrical EngineeringLatent Reliability DegradationOxide Lifetime	2002	49
Electron spin resonance of separation by implanted oxygen oxides: Evidence for structural change and a deep electron trap John F. Conley, Patrick M. Lenahan, P. Roitman Applied Physics Letters EngineeringMagnetic ResonanceImplanted OxygenChemistrySpin Dynamic	1992	42
Evidence for a deep electron trap and charge compensation in separation by implanted oxygen oxides John F. Conley, Patrick M. Lenahan, P. Roitman IEEE Transactions on Nuclear Science EngineeringMagnetic ResonanceChemistryCharge TransportMagnetism	1992	33
Dose dependence of microstructural development of buried oxide in oxygen implanted silicon-on-insulator material S. Bagchi, S. J. Krause, P. Roitman Applied Physics Letters Materials ScienceMaterials EngineeringElectrical EngineeringHigh DensityEngineering	1997	26
Boron diffusion in silicon J. F. Marchiando, P. Roitman, John Albers IEEE Transactions on Electron Devices SemiconductorsSemiconductor TechnologyElectrical EngineeringBoron DiffusionAnnealing/diffusion Model	1985	17
Verification of models for fabrication of Arsenic source-drains in VLSI MOSFET's John Albers, P. Roitman, Charles L. Wilson IEEE Transactions on Electron Devices EngineeringVlsi MosfetIon Beam InstrumentationIntegrated CircuitsSilicon On Insulator	1983	16
<title>Mosquito noise in MPEG-compressed video: test patterns and metrics</title> C.P. Fenimore, John M. Libert, P. Roitman Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringVideo Coding FormatVideo ProcessingImage AnalysisData Science	2000	16

Page 1