T. Assis

The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate

Nathaniel A. Dodds, M.J. Martinez, P.E. Dodd et al. · IEEE Transactions on Nuclear Science · 2015 · 85 citations · Full text

Engineering, Aerospace Engineering, Electrical Engineering +17

Frequency Dependence of Alpha-Particle Induced Soft Error Rates of Flip-Flops in 40-nm CMOS Technology

S. Jagannathan, T. D. Loveless, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2012 · 59 citations

Engineering, Computer Engineering, Electrical Engineering +17

Impact of technology scaling on the combinational logic soft error rate

N. N. Mahatme, N. J. Gaspard, T. Assis et al. · 2014 · 46 citations

Engineering, Computer Engineering, Electrical Engineering +17

Angular Effects of Heavy-Ion Strikes on Single-Event Upset Response of Flip-Flop Designs in 16-nm Bulk FinFET Technology

H. Zhang, H. Jiang, T. Assis et al. · IEEE Transactions on Nuclear Science · 2016 · 41 citations

Engineering, Computer Engineering, Electrical Engineering +16

Effects of Threshold Voltage Variations on Single-Event Upset Response of Sequential Circuits at Advanced Technology Nodes

H. Zhang, H. Jiang, T. Assis et al. · IEEE Transactions on Nuclear Science · 2016 · 35 citations

Engineering, Computer Engineering, Electrical Engineering +13