K. M. Mang

Charge trap dynamics in a SiO2 layer on Si by scanning capacitance microscopy

Chi Jung Kang, G. H. Buh, S. Lee et al. · Applied Physics Letters · 1999 · 58 citations

Natural Sciences, Materials Science, Physics +17

Depth dependent carrier density profile by scanning capacitance microscopy

Chi Jung Kang, C. K. Kim, J. D. Lera et al. · Applied Physics Letters · 1997 · 34 citations

Engineering, Electrical Engineering, Materials Science +17

Scaling down of tunnel oxynitride in NAND flash memory: oxynitride selection and reliabilities

Jong-Han Kim, Jung Dal Choi, Wang Chul Shin et al. · 2002 · 24 citations

Engineering, Computer Engineering, Electrical Engineering +15

Direct imaging of SiO2 thickness variation on Si using modified atomic force microscope

K. M. Mang, Yoonho Khang, Young Joo Park et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 12 citations

Natural Sciences, Materials Engineering, Materials Science +17

Structure of nickel silicide on Si(001): An atomic view

Yoonho Khang, Se‐Jong Kahng, K. M. Mang et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1994 · 11 citations

Natural Sciences, Materials Science, Physics +17