G. H. Buh

Real-time evolution of trapped charge in a SiO2 layer: An electrostatic force microscopy study

G. H. Buh, Hyun‐Jong Chung, Young Kuk · Applied Physics Letters · 2001 · 71 citations

Natural Sciences, Materials Science, Physics +17

Charge trap dynamics in a SiO2 layer on Si by scanning capacitance microscopy

Chi Jung Kang, G. H. Buh, S. Lee et al. · Applied Physics Letters · 1999 · 58 citations

Natural Sciences, Materials Science, Physics +17

Imaging of a silicon pn junction under applied bias with scanning capacitance microscopy and Kelvin probe force microscopy

G. H. Buh, Hyun‐Jong Chung, Charn‐Jung Kim et al. · Applied Physics Letters · 2000 · 49 citations

Engineering, Electrical Engineering, Materials Science +17

Electrical characterization of an operating Si <i>pn</i>-junction diode with scanning capacitance microscopy and Kelvin probe force microscopy

G. H. Buh, Hyun‐Jong Chung, J. H. Yi et al. · Journal of Applied Physics · 2001 · 40 citations

Engineering, Electrical Engineering, Materials Science +17

Factors influencing the capacitance–voltage characteristics measured by the scanning capacitance microscope

G. H. Buh, Joseph J. Kopanski, J. F. Marchiando et al. · Journal of Applied Physics · 2003 · 30 citations

Engineering, Electrical Engineering, Materials Science +17