J. H. Yi

Imaging of a silicon pn junction under applied bias with scanning capacitance microscopy and Kelvin probe force microscopy

G. H. Buh, Hyun‐Jong Chung, Charn‐Jung Kim et al. · Applied Physics Letters · 2000 · 49 citations

Engineering, Electrical Engineering, Materials Science +17

Electrical characterization of an operating Si <i>pn</i>-junction diode with scanning capacitance microscopy and Kelvin probe force microscopy

G. H. Buh, Hyun‐Jong Chung, J. H. Yi et al. · Journal of Applied Physics · 2001 · 40 citations

Engineering, Electrical Engineering, Materials Science +17

Fumigant Toxicity of Phenylpropanoids Identified in Asarum sieboldii Aerial Parts to Lycoriella ingenua (Diptera: Sciaridae) and Coboldia fuscipes (Diptera: Scatopsidae)

J. H. Yi, Haribalan Perumalsamy, Byeoung‐Ryeol Choi et al. · Journal of Economic Entomology · 2015 · 20 citations

Life Sciences, Entomology, Toxicology +17