G. Chaumont

The Effects of ELDRS at Ultra-Low Dose Rates

Dakai Chen, James Forney, R.L. Pease et al. · 2010 · 24 citations · Full text

Medicine, Nuclear Engineering, Radiation Dosimetry +13

Charge Collection in Power MOSFETs for SEB Characterisation—Evidence of Energy Effects

V. Ferlet-Cavrois, Fredrik Sturesson, Ali Zadeh et al. · IEEE Transactions on Nuclear Science · 2010 · 24 citations

Engineering, Computer Engineering, Electrical Engineering +13

Statistical Analysis of Heavy-Ion Induced Gate Rupture in Power MOSFETs—Methodology for Radiation Hardness Assurance

V. Ferlet-Cavrois, C. Binois, A. M. J. F. Carvalho et al. · IEEE Transactions on Nuclear Science · 2012 · 21 citations

Engineering, Electrical Engineering, Microelectronics +16

Enhanced Low Dose Rate Sensitivity at Ultra-Low Dose Rates

Dakai Chen, R.L. Pease, Kirby Kruckmeyer et al. · IEEE Transactions on Nuclear Science · 2011 · 20 citations · Full text

Medicine, Electrical Engineering, Radiation Dosimetry +16