S. N. Renfrow

Impurity determination in electronic materials by accelerator mass spectrometry

Floyd D. McDaniel, J. Anthony, J. F. Kirchhoff et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1994 · 20 citations

Accelerator Mass Spectrometry, Spectroscopy, Intrinsic Impurity +4

Nuclear emission microscopies

Barney L. Doyle, D.S. Walsh, S. N. Renfrow et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2001 · 18 citations

Radiation Oncology, Nuclear Engineering, Nuclear Emission Microscopies

Depth profiling analysis of semiconductor materials by accelerator mass spectrometry

Floyd D. McDaniel, J. Anthony, S. N. Renfrow et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1995 · 17 citations

Accelerator Mass Spectrometry, Physics, Analytical Instrumentation +10

TEAMS depth profiles in semiconductors

S. A. Datar, S. N. Renfrow, B. N. Guo et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1997 · 14 citations

Project Management, Management, Business +3

Atom probe tomography of AlInN/GaN HEMT structures

Nabil Dawahre, Gang Shen, S. N. Renfrow et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2013 · 12 citations

Correlated Study, Wide-bandgap Semiconductor, Electrical Engineering +13