Francesco Pintacuda

Heavy Ion Induced Degradation in SiC Schottky Diodes: Bias and Energy Deposition Dependence

Arto Javanainen, K.F. Galloway, Christopher Nicklaw et al. · IEEE Transactions on Nuclear Science · 2016 · 94 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Heavy Ion Induced Degradation in SiC Schottky Diodes: Incident Angle and Energy Deposition Dependence

Arto Javanainen, Marek Turowski, K.F. Galloway et al. · IEEE Transactions on Nuclear Science · 2017 · 52 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Charge Transport Mechanisms in Heavy-Ion Driven Leakage Current in Silicon Carbide Schottky Power Diodes

Arto Javanainen, K.F. Galloway, Véronique Ferlet-Cavrois et al. · IEEE Transactions on Device and Materials Reliability · 2016 · 33 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Accelerated Tests on Si and SiC Power Transistors with Thermal, Fast and Ultra-Fast Neutrons

F. Principato, S. Altieri, L. Abbene et al. · Sensors · 2020 · 25 citations · Full text

Engineering, Electrical Engineering, Nuclear Engineering +17

Statistical Analysis of Heavy-Ion Induced Gate Rupture in Power MOSFETs—Methodology for Radiation Hardness Assurance

V. Ferlet-Cavrois, C. Binois, A. M. J. F. Carvalho et al. · IEEE Transactions on Nuclear Science · 2012 · 21 citations

Engineering, Electrical Engineering, Microelectronics +16