C. Biasotto

X-ray Nanodiffraction on a Single SiGe Quantum Dot inside a Functioning Field-Effect Transistor

N. Hrauda, Jianjun Zhang, E. Wintersberger et al. · Nano Letters · 2011 · 75 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

n-Channel MOSFETs Fabricated on SiGe Dots for Strain-Enhanced Mobility

V D Jovanovi, C. Biasotto, Lis K. Nanver et al. · IEEE Electron Device Letters · 2010 · 42 citations

Engineering, Electrical Engineering, Materials Science +15

Integration of MOSFETs with SiGe dots as stressor material

Lis K. Nanver, Vladimir Jovanović, C. Biasotto et al. · Solid-State Electronics · 2011 · 17 citations

Engineering, Electrical Engineering, Materials Science +14

Characterization and modeling of antireflective coatings of SiO2, Si3N4, and SiOxNy deposited by electron cyclotron resonance enhanced plasma chemical vapor deposition

S. N. M. Mestanza, M. P. Obrador, E. Rodríguez et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2006 · 14 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Silicon nitride thin films deposited by electron cyclotron resonance plasma enhanced chemical vapor deposition for micromechanical system applications

C. Biasotto, J. A. Diniz, A. M. Daltrini et al. · Thin Solid Films · 2008 · 11 citations

Engineering, Materials Engineering, Materials Science +17