Statistics
Publications
11
Citations
272
H-Index
11
Active since
1998
R. Gonella is an author at STMicroelectronics (France) specializing in engineering, electrical engineering, and integrated circuit design.
Publications per year
1998–2022
11
11
Electromigration failure modes in damascene copper interconnects
L. Arnaud, R. Gonella, G. Tartavel et al. · Microelectronics Reliability · 1998 · 25 citations
Engineering, Electrical Engineering, Materials Engineering +14
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