Takeshi Miyachi is an author at Canon (Japan) specializing in applied physics, engineering, and microstructure.
Top concepts
EngineeringApplied PhysicsX-ray ImagingMicrostructureInstrumentationOptoelectronicsMaterial ScienceMicroelectronicsMicrofabricationOptical Properties
Publications per year
1996–2003
2
2
LPP-based reflectometer for characterization of EUV lithography systems
Akira Miyake, Takeshi Miyachi, Mitsuaki Amemiya et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2003 · 16 citations
Beam Intensity Instability, Engineering, Beam Lithography +11
Rows per page
1–2 of 2