Dongsik Kong

Amorphous InGaZnO Thin-Film Transistors—Part I: Complete Extraction of Density of States Over the Full Subband-Gap Energy Range

Yongsik Kim, Minkyung Bae, Woojoon Kim et al. · IEEE Transactions on Electron Devices · 2012 · 81 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +15

Impact of Oxygen Flow Rate on the Instability Under Positive Bias Stresses in DC-Sputtered Amorphous InGaZnO Thin-Film Transistors

Sung‐Chul Kim, Yong Woo Jeon, Yongsik Kim et al. · IEEE Electron Device Letters · 2011 · 72 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +14

Amorphous InGaZnO Thin-Film Transistors—Part II: Modeling and Simulation of Negative Bias Illumination Stress-Induced Instability

Yongsik Kim, Sung‐Chul Kim, Woojoon Kim et al. · IEEE Transactions on Electron Devices · 2012 · 54 citations

Engineering, Optoelectronic Devices, Thin Film Process Technology +16

Differential Ideality Factor Technique for Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors

Minkyung Bae, Daeyoun Yun, Yongsik Kim et al. · IEEE Electron Device Letters · 2012 · 52 citations

Materials Science, Device Modeling, Electrical Engineering +15

Analytical Models for Drain Current and Gate Capacitance in Amorphous InGaZnO Thin-Film Transistors With Effective Carrier Density

Minkyung Bae, Yongsik Kim, Dongsik Kong et al. · IEEE Electron Device Letters · 2011 · 46 citations

Engineering, Analytical Drain, Semiconductor Materials +17