Yong Woo Jeon

Effect of channel thickness on density of states in amorphous InGaZnO thin film transistor

Sang Yeol Lee, Do Hyung Kim, Eugene Chong et al. · Applied Physics Letters · 2011 · 127 citations

Materials Science, Room Temperature, Electrical Engineering +15

Subgap Density-of-States-Based Amorphous Oxide Thin Film Transistor Simulator (DeAOTS)

Yong Woo Jeon, Sung‐Chul Kim, Sangwon Lee et al. · IEEE Transactions on Electron Devices · 2010 · 73 citations

Materials Science, Device Modeling, Electrical Engineering +12

Impact of Oxygen Flow Rate on the Instability Under Positive Bias Stresses in DC-Sputtered Amorphous InGaZnO Thin-Film Transistors

Sung‐Chul Kim, Yong Woo Jeon, Yongsik Kim et al. · IEEE Electron Device Letters · 2011 · 72 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +14

Origin of threshold voltage shift by interfacial trap density in amorphous InGaZnO thin film transistor under temperature induced stress

Bosul Kim, Eugene Chong, Do Hyung Kim et al. · Applied Physics Letters · 2011 · 52 citations

Materials Science, Electrical Engineering, Semiconductor Device +15

Localization effect of a current-path in amorphous In–Ga–Zn–O thin film transistors with a highly doped buried-layer

Eugene Chong, Yong Woo Jeon, Yoon Soo Chun et al. · Thin Solid Films · 2011 · 30 citations

Semiconductor Technology, Electrical Engineering, Engineering +6