Woojoon Kim

Amorphous InGaZnO Thin-Film Transistors—Part I: Complete Extraction of Density of States Over the Full Subband-Gap Energy Range

Yongsik Kim, Minkyung Bae, Woojoon Kim et al. · IEEE Transactions on Electron Devices · 2012 · 83 citations

Engineering, Electrical Engineering, Physics +15

Amorphous InGaZnO Thin-Film Transistors—Part II: Modeling and Simulation of Negative Bias Illumination Stress-Induced Instability

Yongsik Kim, Sung‐Chul Kim, Woojoon Kim et al. · IEEE Transactions on Electron Devices · 2012 · 54 citations

Engineering, Electrical Engineering, Materials Science +17

Differential Ideality Factor Technique for Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors

Minkyung Bae, Daeyoun Yun, Yongsik Kim et al. · IEEE Electron Device Letters · 2012 · 54 citations

Engineering, Electrical Engineering, Materials Science +11

Analytical Models for Drain Current and Gate Capacitance in Amorphous InGaZnO Thin-Film Transistors With Effective Carrier Density

Minkyung Bae, Yongsik Kim, Dongsik Kong et al. · IEEE Electron Device Letters · 2011 · 46 citations

Engineering, Electrical Engineering, Materials Science +17

Modified Conductance Method for Extraction of Subgap Density of States in a-IGZO Thin-Film Transistors

Hagyoul Bae, Sungwoo Jun, Choon Hyeong Jo et al. · IEEE Electron Device Letters · 2012 · 38 citations

Engineering, Electrical Engineering, Materials Science +17