S. Aur

CMOS metal replacement gate transistors using tantalum pentoxide gate insulator

Amitava Chatterjee, R. A. Chapman, K. Joyner et al. · 2002 · 71 citations

Electrical Engineering, Engineering, Nanoelectronics +8

Hot-electron reliability and ESD latent damage

S. Aur, Amitava Chatterjee, T. Polgreen · IEEE Transactions on Electron Devices · 1988 · 64 citations

Engineering, Glow Discharge, Hot-electron Reliability +19

Trends for deep submicron VLSI and their implications for reliability

P.K. Chatterjee, W. R. Hunter, A. Amerasekera et al. · 1995 · 49 citations

Failure Rate Requirements, Engineering, Vlsi Design +20

0.5 micron CMOS for high performance at 3.3 V

R. A. Chapman, C.C. Wei, David A. Bell et al. · 2003 · 47 citations

Engineering, Vlsi Design, Computer Architecture +16

Circuit hot electron effect simulation

S. Aur, D.E. Hocevar, Ping Yang · 1987 · 39 citations

Device Modeling, Electrical Engineering, Circuit Analysis +13