Concepedia

Abraham Arceo de la Peña

AA

Statistics

Publications

3

Citations

124

H-Index

3

Active since

2017

Affiliations

IBM (United States)(Current)

Nova Measuring Instruments (Israel)

Nova Measuring Instruments (United States)

Abraham Arceo de la Peña is an author at IBM (United States) specializing in electrical engineering, engineering, and cmos circuit design.

Publications per year

2017–2019

3

Publications

3

Full Bottom Dielectric Isolation to Enable Stacked Nanosheet Transistor for Low Power and High Performance Applications

J. Zhang, Julien Frougier, Andrew Greene et al. · 2019 · 97 citations

, , +17

Electrical test prediction using hybrid metrology and machine learning

John G. Gaudiello, Susan Emans, Michael Shifrin et al. · 2017 · 17 citations

, , +17

Machine learning and hybrid metrology using scatterometry and LE-XRF to detect voids in copper lines

Dexin Kong, K. Motoyama, Abraham Arceo de la Peña et al. · 2019 · 10 citations

, , +17

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