François Chancerel

Origin of Voids at the SiO₂/SiO₂ and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance

Fuya Nagano, Fumihiro Inoue, Alain Phommahaxay et al. · ECS Journal of Solid State Science and Technology · 2023 · 52 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Void Formation Mechanism Related to Particles During Wafer-to-Wafer Direct Bonding

Fuya Nagano, Serena Iacovo, Alain Phommahaxay et al. · ECS Journal of Solid State Science and Technology · 2022 · 32 citations · Full text

Engineering, Materials Engineering, Materials Science +13

Epitaxial lift-off of InGaAs solar cells from InP substrate using a strained AlAs/InAlAs superlattice as a novel sacrificial layer

François Chancerel, Philippe Régreny, Jean‐Louis Leclercq et al. · Solar Energy Materials and Solar Cells · 2019 · 16 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

IR Laser Release for 3D Stacked Devices: Effect of the Release Stack Structure on the Debonding Mechanism

François Chancerel, Péter Urbán, John Slabbekoorn et al. · 2024 · 10 citations

Engineering, Materials Engineering, Materials Science +17