Concepedia

Author

Bernd Zippelius

Friedrich-Alexander-Universität Erlangen-Nürnberg

Also Known As

B. Zippelius, Bernd Zippelius

29

Publications

358

Citations

11

H-Index

20

Concepts

All Affiliations

Friedrich-Alexander-Universität Erlangen-NürnbergKyoto UniversityInfineon Technologies (Germany)Infineon Technologies (Canada)Kyoto Katsura Hospital
BZ

About

Bernd Zippelius is an author at Friedrich-Alexander-Universität Erlangen-Nürnberg specializing in electrical engineering, engineering, and microelectronics.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

11

11

297

2

Electrical Engineering

11

11

297

3

Applied Physics

9

9

202

4

Materials Engineering

2

2

84

5

Materials Science

2

2

84

Bernd Zippelius

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11

Publications

297

Citations

11

H-Index

YearCitations

High temperature annealing of n-type 4H-SiC: Impact on intrinsic defects and carrier lifetime

Bernd Zippelius, Jun Suda, Tsunenobu Kimoto

Journal of Applied Physics

2012

71

A SiC Trench MOSFET concept offering improved channel mobility and high reliability

Ralf Siemieniec, Dethard Peters, Romain Esteve,

2017

70

The New CoolSiC™ Trench MOSFET Technology for Low Gate Oxide Stress and High Performance

Dethard Peters, Thomas Basler, Bernd Zippelius,

2017

25

Charge Pumping Measurements on Differently Passivated Lateral 4H-SiC MOSFETs

Alberto Salinaro, Gregor Pobegen, Thomas Aichinger,

IEEE Transactions on Electron Devices

2014

24

Control of carbon vacancy in SiC toward ultrahigh-voltage power devices

Tsunenobu Kimoto, Kota Kawahara, Bernd Zippelius,

Superlattices and Microstructures

2016

20

Lifetime Investigations of 4H-SiC PiN Power Diodes

Sergey A. Reshanov, Wolfgang Bartsch, Bernd Zippelius,

Materials science forum

2009

17

A New 1200V SiC MPS Diode with Improved Performance and Ruggedness

M. Drãghici, Roland Rupp, R. Gerlach,

Materials science forum

2015

16

Correlation between Leakage Current and Stacking Fault Density of p-n Diodes Fabricated on 3C-SiC

Takamitsu Kawahara, Naoki Hatta, Kuniaki Yagi,

Materials science forum

2010

14

Avalanche Robustness of SiC MPS Diodes

Thomas Basler, Roland Rupp, R. Gerlach,

PCIM Europe 2016; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management; Proceedings of

2016

14

Thermal Stability of Defect Centers in n- and p-Type 4H-SiC Epilayers Generated by Irradiation with High-Energy Electrons

Sergey A. Reshanov, Svetlana Beljakowa, Bernd Zippelius,

Materials science forum

2010

13

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