Scott D. Stansberry

Models and Algorithmic Limits for an ECC-Based Approach to Hardening Sub-100-nm SRAMs

Michael Bajura, Y. Boulghassoul, Riaz Naseer et al. · IEEE Transactions on Nuclear Science · 2007 · 114 citations

Engineering, Computer Engineering, Electrical Engineering +13

NASA Goddard Space Flight Center’s Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

Alvson D. Topper, Edward J. Wyrwas, Kaitlyn L. Ryder et al. · 2019 · 18 citations

Engineering, Aerospace Engineering, Electrical Engineering +16

Single-Event Effects on Commercial-Off-the-Shelf Edge-Processing Artificial Intelligence ASICs

Megan C. Casey, Justin Goodwill, Edward J. Wyrwas et al. · IEEE Transactions on Nuclear Science · 2023 · 18 citations

Computing, Computer Engineering, Computer Science +16

Development of a Low-Cost and High-speed Single Event Effects Testers based on Reconfigurable Field Programmable Gate Arrays (FPGA)

James W. Howard, H. Kim, Melanie D. Berg et al. · NASA Technical Reports Server (NASA) · 2006 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +14

Characterization of Single-Event Transients in Schmitt Trigger Inverter Chains Operating at Subthreshold Voltages

Matthew J. Gadlage, Jonathan R. Ahlbin, Peter Gadfort et al. · IEEE Transactions on Nuclear Science · 2016 · 14 citations

Engineering, Electrical Engineering, Physics +13