Single-Event Effects on Commercial-Off-the-Shelf Edge-Processing Artificial Intelligence ASICs

Abstract

Single-event effects (SEEs) test results are presented for heavy ions and high-energy protons on two commercial edge-processing artificial intelligence (AI) application-specific integrated circuits (ASICs), particularly the Google Coral Accelerator Module, which employs a Google Coral Edge Tensor Processing Unit (TPU), and the Intel Neural Compute Stick 2 (NCS2), which employs the Intel Movidius Myriad X. The observed SEE signatures, probable causes within the devices, and single-event functional interrupt (SEFI) cross sections are discussed. Ultimately, when single-event upsets (SEUs) or SEFIs are observed, there are negligible changes in the measured precision or accuracy of the algorithm, and rarely do the errors result in incorrect identification or classification.