H. Naqvi is an author at University of New Mexico specializing in optical metrology, optical properties, and photonic metrology.
Top concepts
MicroscopyEngineeringLength MetrologyOptical MetrologyOrganic PhotonicsOptical PropertiesPhotonic MetrologyGratingsMedicineCalibration
Publications per year
1994–1997
3
3
Multiparameter grating metrology using optical scatterometry
Christopher J. Raymond, Michael R. Murnane, Steven L. Prins et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1997 · 106 citations
Optical Materials, Engineering, Electron-beam Lithography +29
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1–3 of 3