Shiro Kamohara

The Impact of Random Telegraph Signals on the Scaling of Multilevel Flash Memories

Hiroki Kurata, K. Otsuga, Akira Kotabe et al. · 2006 · 123 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +12

Anomalously Large Threshold Voltage Fluctuation by Complex Random Telegraph Signal in Floating Gate Flash Memory

Naoki Tega, Hiroshi Miki, T. Osabe et al. · 2006 · 93 citations

Non-volatile Memory, Electrical Engineering, Engineering +9

Random Telegraph Signal in Flash Memory: Its Impact on Scaling of Multilevel Flash Memory Beyond the 90-nm Node

Hideaki Kurata, K. Otsuga, Akira Kotabe et al. · IEEE Journal of Solid-State Circuits · 2007 · 88 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +12

Direct Measurement of Correlation Between SRAM Noise Margin and Individual Cell Transistor Variability by Using Device Matrix Array

Toshiro Hiramoto, Makoto Suzuki, Xiaowei Song et al. · IEEE Transactions on Electron Devices · 2011 · 70 citations

Electrical Engineering, Engineering, Vlsi Design +14

Analyses of 5σ V<inf>th</inf> fluctuation in 65nm-MOSFETs using takeuchi plot

Takaaki Tsunomura, Akio Nishida, Fumiko Yano et al. · 2008 · 47 citations

Device Modeling, B Atoms, Electrical Engineering +12