P. Mortini

Investigation on different ESD protection strategies devoted to 3.3 V RF applications (2 GHz) in a 0.18 μm CMOS process

C. Richier, P. Salome, G. Mabboux et al. · 2002 · 145 citations

Engineering, Electrical Engineering, Microelectronics +13

On the charge build-up mechanisms in gate dielectrics

C. Papadas, G. Ghibaudo, F. Pio et al. · Solid-State Electronics · 1994 · 37 citations

Engineering, Electrical Engineering, Physics +14

Dielectric reliability in deep-submicron technologies: From thin to ultrathin oxides

Emmanuel Vincent, S. Bruyère, C. Papadas et al. · Microelectronics Reliability · 1997 · 34 citations

Natural Sciences, Materials Engineering, Materials Science +16

Investigation on different ESD protection strategies devoted to 3.3V RF applications (2GHz) in a 0.18μm CMOS process

C. Richier, P. Salome, G. Mabboux et al. · Journal of Electrostatics · 2002 · 29 citations

Engineering, Electrical Engineering, Microelectronics +13

Analysis of high temperature effects on performances and hot-carrier degradation in DC/AC stressed 0.35 μm n-MOSFETs

A. Bravaix, D. Goguenheim, N. Revil et al. · Microelectronics Reliability · 1999 · 23 citations

Engineering, Electrical Engineering, Materials Science +14