Norman J. Rohrer

High-performance CMOS variability in the 65-nm regime and beyond

K. Bernstein, D.J. Frank, Anne Gattiker et al. · IBM Journal of Research and Development · 2006 · 557 citations

Engineering, Computer Engineering, Electrical Engineering +17

High Performance CMOS Variability in the 65nm Regime and Beyond

Sani Nassif, Kerry Bernstein, D.J. Frank et al. · 2007 · 132 citations

Engineering, Electrical Engineering, Materials Engineering +17

A 480-MHz RISC microprocessor in a 0.12-μm L/sub eff/ CMOS technology with copper interconnects

C. Akrout, Jörg Bialas, M. Canada et al. · IEEE Journal of Solid-State Circuits · 1998 · 65 citations

Engineering, Computer Engineering, Electrical Engineering +17

A 580 MHz RISC microprocessor in SOI

M. Canada, C. Akrout, D. Cawthron et al. · 2003 · 44 citations

Engineering, Computer Engineering, Electrical Engineering +13

Electrostatic discharge protection in silicon-on-insulator technology

Steven H. Voldman, David Hui, L. Warriner et al. · 2003 · 36 citations

Engineering, Electrical Engineering, Microelectronics +16