Sani Nassif

High Performance CMOS Variability in the 65nm Regime and Beyond

Sani Nassif, Kerry Bernstein, D.J. Frank et al. · 2007 · 132 citations

Low-power Electronics, Power Consumption, Electrical Engineering +14

Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events

Rouwaida Kanj, Sani Nassif · Proceedings - ACM IEEE Design Automation Conference · 2006 · 78 citations

Engineering, Vlsi Design, Computer Architecture +21

Rigorous Extraction of Process Variations for 65-nm CMOS Design

Wei Zhao, Frank Liu, Kanak Agarwal et al. · IEEE Transactions on Semiconductor Manufacturing · 2009 · 67 citations

Hardware Security, Device Modeling, Electrical Engineering +14

Rigorous extraction of process variations for 65nm CMOS design

Wei Zhao, Yu Cao, Frank Liu et al. · 2007 · 38 citations

Device Modeling, Electrical Engineering, Physical Design (Electronics) +13

System-Level SRAM Yield Enhancement

Fadi Kurdahi, Ahmed M. Eltawil, Young-Hwan Park et al. · 2006 · 32 citations

Hardware Security, Electrical Engineering, Memory Architecture +14