G. Declerck

Theory of the MOS transistor in weak inversion-new method to determine the number of surface states

R.J. Van Overstraeten, G. Declerck, Paul A. Muls · IEEE Transactions on Electron Devices · 1975 · 177 citations

Device Modeling, Electrical Engineering, Semiconductor Device +14

Explaining the amplitude of RTS noise in submicrometer MOSFETs

Eddy Simoen, B. Dierickx, Cor Claeys et al. · IEEE Transactions on Electron Devices · 1992 · 144 citations

Electrical Engineering, Engineering, Physics +12

A self-aligned cobalt silicide technology using rapid thermal processing

Luc Van den hove, R.A.M. Wolters, Karen Maex et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1986 · 101 citations

Materials Science, Engineering, Electronic Materials +10

A self-aligned CoSi₂interconnection and contact technology for VLSI applications

Luc Van den hove, R.A.M. Wolters, Karen Maex et al. · IEEE Transactions on Electron Devices · 1987 · 98 citations

Engineering, Vlsi Design, Integrated Circuits +19

Observation of hot-hole injection in NMOS transistors using a modified floating-gate technique

N. S. Saks, Paul Heremans, Luc Van den hove et al. · IEEE Transactions on Electron Devices · 1986 · 79 citations

Device Modeling, Electrical Engineering, High Resolution +12