Takehiko Tawara

Short minority carrier lifetimes in highly nitrogen-doped 4H-SiC epilayers for suppression of the stacking fault formation in PiN diodes

Takehiko Tawara, Tetsuya Miyazawa, Mina Ryo et al. · Journal of Applied Physics · 2016 · 111 citations

Semiconductors, Materials Science, Electrical Engineering +12

Structural analysis and reduction of in-grown stacking faults in 4H–SiC epilayers

Syunsuke Izumi, Hidekazu Tsuchida, I. Kamata et al. · Applied Physics Letters · 2005 · 110 citations

Materials Science, In-grown Stacking Faults, Fault Density +9

Telecom-band lasing in single InP/InAs heterostructure nanowires at room temperature

Guoqiang Zhang, Masato Takiguchi, Kouta Tateno et al. · Science Advances · 2019 · 96 citations · Full text

Photonics, Electrical Engineering, Room Temperature +13

Cavity Polaritons in InGaN Microcavities at Room Temperature

Takehiko Tawara, Hideki Gotoh, Tetsuya Akasaka et al. · Physical Review Letters · 2004 · 85 citations

Photonics, Quantum Science, Quantum Photonics +12

Low-threshold lasing of InGaN vertical-cavity surface-emitting lasers with dielectric distributed Bragg reflectors

Takehiko Tawara, Hideki Gotoh, Tetsuya Akasaka et al. · Applied Physics Letters · 2003 · 75 citations

Optical Materials, Engineering, Dry Etching Technique +16