Syunsuke Izumi

Structural analysis and reduction of in-grown stacking faults in 4H–SiC epilayers

Syunsuke Izumi, Hidekazu Tsuchida, I. Kamata et al. · Applied Physics Letters · 2005 · 110 citations

Materials Science, In-grown Stacking Faults, Fault Density +9

Evaluation of Free Carrier Lifetime and Deep Levels of the Thick 4H-SiC Epilayers

Takeshi Tawara, Hidekazu Tsuchida, Syunsuke Izumi et al. · Materials science forum · 2004 · 72 citations

Materials Engineering, Electrical Engineering, Engineering +8

Rapid and sensitive detection of neuron specific enolase with a polydopamine coated plasmonic chip utilizing a rear-side coupling method

Mana Toma, Syunsuke Izumi, Keiko Tawa · The Analyst · 2017 · 30 citations

Growth and Characterization of the 4H-SiC Epilayers on Substrates with Different Off-Cut Directions

Hidekazu Tsuchida, Isaho Kamata, Syunsuke Izumi et al. · Materials science forum · 2004 · 15 citations

Materials Engineering, Materials Science, Engineering +7

Structure of In-Grown Stacking Faults in the 4H-SiC Epitaxial Layers

Syunsuke Izumi, Hidekazu Tsuchida, Takeshi Tawara et al. · Materials science forum · 2005 · 14 citations

Materials Engineering, Materials Science, Electrical Engineering +15