Publication | Closed Access
Evaluation of Free Carrier Lifetime and Deep Levels of the Thick 4H-SiC Epilayers
72
Citations
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References
2004
Year
Materials EngineeringElectrical EngineeringEngineeringDeep LevelsApplied PhysicsFree Carrier LifetimeSemiconductor Device FabricationMicroelectronicsCarbideSemiconductor DeviceThick 4H-sic Epilayers
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