Publication | Closed Access
Growth and Characterization of the 4H-SiC Epilayers on Substrates with Different Off-Cut Directions
15
Citations
6
References
2004
Year
Materials EngineeringMaterials ScienceEngineeringApplied Physics4H-sic EpilayersSemiconductor Device FabricationMolecular Beam EpitaxyEpitaxial GrowthCarbideDifferent Off-cut Directions
| Year | Citations | |
|---|---|---|
Page 1
Page 1