Sing-Pin Tay

SiO 2 film thickness metrology by x-ray photoelectron spectroscopy

Zhaoming Lu, J. P. McCaffrey, B. Brar et al. · Applied Physics Letters · 1997 · 225 citations

Natural Sciences, Materials Engineering, Materials Science +17

The effect of rapid thermal N2O nitridation on the oxide/Si(100) interface structure

Zhaoming Lu, Sing-Pin Tay, Renping Cao et al. · Applied Physics Letters · 1995 · 127 citations

Natural Sciences, Materials Engineering, Materials Science +17

Transistor characteristics with Ta/sub 2/O/sub 5/ gate dielectric

Donggun Park, Ya‐Chin King, Qiang Lu et al. · IEEE Electron Device Letters · 1998 · 102 citations

Engineering, Electrical Engineering, Materials Science +17

Measurements and Modeling of Thin Silicon Dioxide Films on Silicon

A. Kalnitsky, Sing-Pin Tay, J. P. Ellul et al. · Journal of The Electrochemical Society · 1990 · 70 citations

Natural Sciences, Materials Engineering, Materials Science +17

Kinetic investigation of copper film oxidation by spectroscopic ellipsometry and reflectometry

Yao Hu, R. Sharangpani, Sing-Pin Tay · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2000 · 61 citations

Natural Sciences, Materials Engineering, Materials Science +16