Concepedia
Statistics
Publications
10
Citations
278
H-Index
Active since
1985
Affiliations
Nortel (Canada)(Current)
University of North Carolina at Chapel Hill
Carleton University
United States Department of the Army
J. P. Ellul is an author at Nortel (Canada) specializing in materials science, engineering, and materials engineering.
Publications per year
1985–1997
Measurements and Modeling of Thin Silicon Dioxide Films on Silicon
A. Kalnitsky, Sing-Pin Tay, J. P. Ellul et al. · Journal of The Electrochemical Society · 1990 · 70 citations
Natural Sciences, Materials Engineering, Materials Science +17
Refractive Index Profiles of Thermally Grown and Chemically Vapor Deposited Films on Silicon
S. Chongsawangvirod, E. A. Irene, A. Kalnitsky et al. · Journal of The Electrochemical Society · 1990 · 36 citations
A model of charge transport in thermal SiO2 implanted with Si
A. Kalnitsky, Arthur Boothroyd, J. P. Ellul · Solid-State Electronics · 1990 · 35 citations
Engineering, Materials Engineering, Materials Science +14
Rechargeable <i>E</i>′ centers in silicon-implanted SiO2 films
A. Kalnitsky, J. P. Ellul, Edward H. Poindexter et al. · Journal of Applied Physics · 1990 · 33 citations
Engineering, Materials Engineering, Materials Science +17
Electronic states at SiSiO2 interface introduced by implantation of Si in thermal SiO2
A. Kalnitsky, Arthur Boothroyd, J. P. Ellul et al. · Solid-State Electronics · 1990 · 30 citations
Engineering, Materials Engineering, Materials Science +16
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